Rules By Area (RBA)

A powerful extension to the Zuken P.R. Editor XR tool-set is the unique Rules-by-Area option that enhances the best in Zuken’s routing technology by being able to associate different technology-rules to different areas of the design. It is available as a cost-option for the standalone P.R.Editor XR 2000, XR 2000 S, XR 2000 HS, CADSTAR Platinum Plus, Platinum S Plus or Platinum HS Plus and comes as standard with P.R.Editor XR 5000, XR 5000 HS, CADSTAR Diamond or Diamond HS.

  • Improve manufacturing yield
  • Reduce layout design times
  • Reduce design rule checking violations
  • Automate width/spacing changes
  • Automate via changes
  • Improve routing completion
  • Reduce layer count
  • Available with all P.R.Editor XR variants

Design Rule Checking by Areas
In response to the constantly evolving technological and manufacturing challenges, Zuken has added Rules-by-Area to P.R.Editor XR so that it can handle designs requiring localized design rules. This cost-option feature is complemented with full design rule checking in these areas.

Constraint Driven
Critical, dense areas of the design can receive tighter manufacturing related spacing requirements. This not only improves routing completion, but ensures that the design will be error free and manufacturable.

Rules-by-Area means more:-

  • You can route automatically using reduced track width, via sizes and spacing around small complex dense components such as BGA’s, Wire Bonded, CSP’s and SMD to achieve 100% routing and reduce the layer count.
  • All area rules are obeyed dynamically during interactive and automatic routing.
  • No limit to the number of areas defined
  • Overlapping areas can be allowed
  • Any shape area can be defined
  • Areas can be copied and their technology restriction rules will be maintained

Different Track Spacings, Widths and Via Sizes for Nominated Areas.
Exceptional routing detail, e.g. microvias, fine-line tracks and very small track, via and pad spacings can be specified. This is particularly appropriate around BGA’S, CSP’s, fine-pitched connectors and chip-packaging designs.

Improved Manufacturing Yield
The relevant nets within the rules area will be routed according to the exceptional restrictions. This will lead to a significant improvement in manufacturing yield because only the special area will be subjected to the fine widths and spacings.

Technology Rules Supported by Area:
Via size, Via to Copper, Via to pin, Via to Profile, Via to SMD, Via to Via, Via to Area, Track width, Track Optional Width, Optional Track to Pin, Optional Track to Track, Optional Track to Via, Track to Pin, Track to Via, Track to Track, Track to Copper, Track to SMD, Track to Area, Track to Profile, Copper to Copper, Copper to Profile, Pin to Copper, Pin to Pin, Pin to Profile, Pin to SMD, SMD to Copper, SMD to Profile, SMD to SMD, Testpoint to Testpoint, Testpoint to Profile.